Two-step interconnect testing of semiconductor dies
- Application ID: EP13162824
- Status: █ EXAMINATION IN PROGRESS
This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) DenK iP bvba is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 119 others are specialized in all of these IPC classes as well. For a similar patent, they might be a good choice.