Method and apparatus for combination of localization microscopy and structured illumination microscopy
- Application ID: EP13002490
- Status: █ The patent has been granted
This EP application has the IPC class G01 (MEASURING; TESTING) and G02 (OPTICS). We found, that TransMIT GmbH, Müller Hoffmann & Partner, Oehmke & Kollegen, Sarap & Putk Patent Agency, Bird Goën & Co NV and 46 others are specialized in this combination either. For a similar patent, they might be a good choice.