Method and apparatus for combination of localization microscopy and structured illumination microscopy
- Application ID: EP13002490
- Status: █ The patent has been granted
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This EP application has the IPC class G01 (MEASURING; TESTING) and G02 (OPTICS). We found, that TransMIT GmbH, Müller Hoffmann & Partner, Oehmke & Kollegen, Plougmann & Vingtoft A/S, Bird Goën & Co NV and 55 others are specialized in this combination either. For a similar patent, they might be a good choice.
Timeline
- 12.11.2014 - Publication A1 (EP2801854)
- 19.07.2017 - Publication B1 (EP2801854)