Method and apparatus for combination of localization microscopy and structured illumination microscopy

  • Application ID: EP13002490
  • Status: █ GRANT OF PATENT INTENDED

Attorney

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and G02 (OPTICS) is specialized in the combination G01 and G02. We found, that TransMIT GmbH, Müller Hoffmann & Partner, Oehmke & Kollegen, Sarap & Putk Patent Agency, Bird Goën & Co NV and 47 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 12.11.2014 - Publication A1 (EP2801854)