Priority Date: 28.12.11 (JP 20110287397)

METHOD FOR MEASURING FILM THICKNESS DISTRIBUTION

  • Application ID: EP12863632
  • Status: PATENT GRANTED

Applicant

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Technology Company

Attorney

operating since 1927
Headquarter in Munich
active in Legal Services

Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 117 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 28.12.2011 - Priority Date (JP 20110287397)
  • 04.07.2013 - Publication A1 (WO2013099107)
  • 05.11.2014 - Publication A1 (EP2799808)
  • 31.08.2016 - Publication B1 (EP2799808)

IPC Classification