Priority Date: 01.12.11 (JP 20110263927)

SCINTILLATOR ARRAY, AND X-RAY DETECTOR AND X-RAY EXAMINATION DEVICE USING SCINTILLATOR ARRAY

  • Application ID: EP12853509
  • Status: █ GRANT OF PATENT INTENDED

Applicants

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Toshiba Corporation (Kabushiki Kaisha Toshiba)
Technology Company
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Toshiba Materials Co., Ltd.
Technology Company

Attorney

Employment test 51 - 200 employees
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Company dna hoffmann eitle
operating since 1892
1189.63
Hoffmann Eitle PartmbB
Headquarter in Munich and 4 offices
active in Legal Services and IP Portfolio Processing

Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 01.12.2011 - Priority Date (JP 20110263927)
  • 06.06.2013 - Publication A1 (WO2013080565)
  • 22.10.2014 - Publication A1 (EP2793052)

IPC Classification