Priority Date: 01.12.11 (US 201161565506P)

HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE THINNING OF CROSS-SECTIONAL VIEW LAMELLA

  • Application ID: EP12852813
  • Status: PATENT GRANTED

Applicant

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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H01 (BASIC ELECTRIC ELEMENTS) is specialized in the combination G01 and H01. We found, that Coller IP Management Ltd, TransMIT GmbH, Müller Hoffmann & Partner, Patentanwälte Rauschenbach, Patentanwaltskanzlei Dr. Steiniger and 120 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 01.12.2011 - Priority Date (US 201161565506P)
  • 06.06.2013 - Publication A1 (WO2013082496)
  • 08.10.2014 - Publication A1 (EP2786113)
  • 01.03.2017 - Publication B1 (EP2786113)

IPC Classification