YIELD MONITORING APPARATUS, SYSTEMS, AND METHODS
- Application ID: EP12821451
- Status: █ GRANT OF PATENT INTENDED
This patent has the IPC combination G01 (MEASURING; TESTING) and G06 (COMPUTING; CALCULATING; COUNTING) Barker Brettell LLP is specialized in the combination G01 and G06. We found, that Coller IP Management Ltd, Schweiger & Partners, Gill Jennings & Every LLP, Kilburn & Strode LLP, KOPPEL patendibüroo OÜ and 85 others are specialized in all of these IPC classes as well. For a similar patent, they might be a good choice.