Priority Date: 21.12.11 (IT 2011MI02295)

OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PROBE SPECTROSCOPY MEASUREMENTS APPLIED IN A WIDE SPATIAL REGION WITH AN EXTENDED RANGE OF FORCE SENSITIVITY.

  • Application ID: EP12820910
  • Status: GRANT OF PATENT INTENDED

Applicant

Attorney

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Specialization

This patent has the IPC combination B82, G01, and G21 is specialized in the combination B82, G01, and G21. There is no patent agent firm in the market, which is specialized in this combination of IPC classes.

Timeline

  • 21.12.2011 - Priority Date (IT 2011MI02295)
  • 27.06.2013 - Publication A1 (WO2013093732)
  • 29.10.2014 - Publication A1 (EP2795346)

IPC Classification