Priority Date: 24.10.11 (DE 201110116698)

METHOD FOR CORRECTING OFFSET DRIFT EFFECTS OF A THERMAL MEASURING DEVICE, THERMAL MEASURING DEVICE AND GAS THROUGHFLOW MEASURING APPARATUS

  • Application ID: EP12795329
  • Status: GRANT OF PATENT INTENDED

Applicant

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Technology Company

Attorney

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 24.10.2011 - Priority Date (DE 201110116698)
  • 02.05.2013 - Publication A2 (WO2013060441)
  • 03.09.2014 - Publication A2 (EP2771651)

IPC Classification