Priority Date: 26.08.11 (EP 20110179117)

ARRANGEMENTS AND METHOD FOR DETERMINING A CONTACT RESISTANCE OF ELECTRICALLY CONDUCTIVE LAYERS

  • Application ID: EP12759663
  • Status: PATENT GRANTED

Applicant

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operating since 1873
Headquarter in Munich
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Specialization

This patent has the IPC combination G01 (MEASURING; TESTING) and H05 (ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR) is specialized in the combination G01 and H05. We found, that Lippert Stachow & Partner, Jakelski & Althoff Patentanwälte PartG mbB, Blumbach Zinngrebe Patent-und Rechtsanwälte GbR patentConsult, Bonsmann Bonsmann Frank, Patentanwaltskanzlei Backhaus and 27 others are specialized in all of these IPC classes. For a similar patent, they might be a good choice.

Timeline

  • 26.08.2011 - Priority Date (EP 20110179117)
  • 07.03.2013 - Publication A1 (WO2013030070)
  • 02.07.2014 - Publication A1 (EP2748620)
  • 21.09.2016 - Publication B1 (EP2748620)