Priority Date: 07.09.11 (EP 20110180313)

METHOD AND APPARATUS FOR ESTIMATING THE TEMPERATURE OF A SEMICONDUCTOR CHIP

  • Application ID: EP12750735
  • Status: NO OPPOSITION FILED WITHIN TIMELIMIT

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Specialization

This EP application has the IPC combination F03, G01, and H01. We found, that TransMIT GmbH, Dr. Meyer-Dulheuer & Partner, Hansen und Heeschen, Kransell & Wennborg KB, LOVEN Patents & Trademarks Limited and 2 others are specialized in this combination either. For a similar patent, they might be a good choice.

Timeline

  • 07.09.2011 - Priority Date (EP 20110180313)
  • 14.03.2013 - Publication A1 (WO2013034400)
  • 16.07.2014 - Publication A1 (EP2753903)
  • 23.03.2016 - Publication B1 (EP2753903)