Priority Date: 14.07.04 (CN 2004168880)

A measuring device for the short-wavelength X-ray diffraction and a method thereof

  • Application ID: EP12183863
  • Status: NO OPPOSITION FILED WITHIN TIMELIMIT

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Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 14.07.2004 - Priority Date (CN 2004168880)
  • 02.01.2013 - Publication A1 (EP2541238)
  • 16.12.2015 - Publication B1 (EP2541238)

IPC Classification