Priority Date: 20.07.11 (US 201161510047P)

Methods for improving integrated photonic device uniformity

  • Application ID: EP12177230
  • Status: NO OPPOSITION FILED WITHIN TIMELIMIT

Applicants

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Specialization

This EP application has the IPC combination G01 (MEASURING; TESTING) and G02 (OPTICS). DenK iP bvba is specialized in the combination G01 and G02. We found, that TransMIT GmbH, Müller Hoffmann & Partner, Oehmke & Kollegen, Engel Patentanwaltskanzlei, Plougmann & Vingtoft A/S and 57 others are specialized in all of these IPC classes as well. For a similar patent, they might be a good choice.

Timeline

  • 20.07.2011 - Priority Date (US 201161510047P)
  • 23.01.2013 - Publication A1 (EP2549224)
  • 04.05.2016 - Publication B1 (EP2549224)

IPC Classification