Priority Date: 01.02.11 (DE 20111009983)

Method and device for detecting the contours of objects and components

  • Application ID: EP12000619
  • Status: PATENT GRANTED

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 01.02.2011 - Priority Date (DE 20111009983)
  • 23.04.2014 - Publication A1 (EP2722641)
  • 27.07.2016 - Publication B1 (EP2722641)

IPC Classification