AN ILLUMINATION SYSTEM FOR DETECTING THE DEFECT IN A TRANSPARENT SUBSTRATE AND A DETECTION SYSTEM INCLUDING THE SAME

  • Application ID: EP11878545
  • Status: APPLICATION DEEMED TO BE WITHDRAWN

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Technology Company

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Specialization

This patent has the IPC class G01 (MEASURING; TESTING) is specialized in G01. Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 04.07.2013 - Publication A1 (WO2013097215)
  • 05.11.2014 - Publication A1 (EP2798337)

IPC Classification