METHOD AND APPARATUS FOR COMPENSATING FOR A PARAMETER CHANGE IN A SYNTHETIC APERTURE IMAGING SYSTEM

  • Application ID: EP10853830
  • Status: GRANT OF PATENT INTENDED

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Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Cabinet Germain & Maureau is specialised in G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 05.01.2012 - Publication A1 (WO2012000074)
  • 01.05.2013 - Publication A1 (EP2585849)

IPC Classification