A method and apparatus for detecting errors in grain analysis apparatus using electronically processed images
- Application ID: EP08164287
- Status: █ No opposition filed within time limit
This EP application has the IPC class G01 (MEASURING; TESTING) and G06 (COMPUTING; CALCULATING; COUNTING). We found, that Coller IP Management Ltd, Schweiger & Partners, Marks & Clerk, Kilburn & Strode LLP, Santarelli and 94 others are specialized in this combination either. For a similar patent, they might be a good choice.