Priority Date: 31.08.05 (DE 20051041203)

DEVICE AND METHOD FOR THE INTERFEROMETRIC MEASUREMENT OF PHASE MASKS

  • Application ID: EP06777129
  • Status: The application is deemed to be withdrawn

Applicant

Technology company logo small
Technology Company

Attorney

Employment test 1 - 10 employees
Company dna geyer fehners and partner
no operation time available
Headquarter in Munich and 1 office
active in Legal Services and IP Consulting

Specialization

This EP application has the IPC class G01 (MEASURING; TESTING). Here you find a list of all patent agent firms which are specialized in this IPC class. For a similar patent, they might be a good choice.

Timeline

  • 31.08.2005 - Priority Date (DE 20051041203)
  • 08.03.2007 - Publication A1 (WO2007025746)
  • 14.05.2008 - Publication A1 (EP1920227)

IPC Classification